A comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniques
- Lynne Gignac
- C.E. Murray
- et al.
- 2002
- Microscopy and Microanalysis
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126 results for Ken Rodbell
Crystallographic texture of C54 titanium disilicide as a function of deep submicron structure geometry
- V. Svilan
- K.P. Rodbell
- et al.
- 1997
- Journal of Electronic Materials
Environmental radiation impact on lifetimes and quasiparticle tunneling rates of fixed-frequency transmon qubits
- R.T. Gordon
- Conal E. Murray
- et al.
- 2022
- Applied Physics Letters
Thin film deposition research and its impact on microelectronics scaling
- Cyril Cabral
- Christian Lavoie
- et al.
- 2020
- JVSTA
Low-Energy Protons - Where and Why 'Rare Events' Matter
- Ken Rodbell
- 2020
- IEEE TNS
Challenges facing copper-plated metallisation for silicon photovoltaics: Insights from integrated circuit technology development
- Alison Lennon
- Jack Colwell
- et al.
- 2018
- Progress in Photovoltaics
Low Energy Proton SEUs in 32-nm SOI SRAMs at Low Vdd
- Ken Rodbell
- Michael S. Gordon
- et al.
- 2017
- IEEE TNS
The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2017
- IEEE TNS
Measurements of radioactive contaminants in semiconductor materials
- Michael S. Gordon
- Ken Rodbell
- et al.
- 2016
- Semiconductor Science and Technology
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS