High-sensitivity silicide films for optical recording
- K.Y. Ahn
- T.H. Distefano
- et al.
- 1982
- Journal of Applied Physics
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20 results for T.H. Distefano
On Al–SiO2interfaces and oxidation temperatures
- M. Av-Ron
- M. Shatzkes
- et al.
- 1980
- Japanese Journal of Applied Physics
Fine structure in elastic-electron-yield spectra at transition-metal core energies
- Terrence Jach
- T.H. DiStefano
- 1979
- Physical Review B
Electronic structure of SiO2, SixGe1-xO2, and GeO2 from photoemission spectroscopy
- B. Fischer
- R.A. Pollak
- et al.
- 1977
- Physical Review B
Hydrogen induced interfacial polarization at PdSiO2 interfaces
- Ingemar Lundström
- Thomas DiStefano
- 1976
- Surface Science
Influence of hydrogen on PtSiO2Si structures
- I. Lundström
- T.H. DiStefano
- 1976
- Solid State Communications
Polarization Layer at Metal/Insulator Interfaces
- C.G. Wang
- T.H. Distefano
- 1975
- C R C Critical Reviews in Solid State Sciences
Photoemission from CsI: Experiment
- T.H. DiStefano
- W.E. Spicer
- 1973
- Physical Review B
Photoemission from CsI: Calculation
- T.H. DiStefano
- 1973
- Physical Review B
The band edge of amorphous SiO2 by photoinjection and photoconductivity measurements
- T.H. DiStefano
- D.E. Eastman
- 1971
- Solid State Communications