Thermoluminescence and color centers in rf-sputtered SiO2 films
- T.W. Hickmott
- 2008
- Journal of Applied Physics
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38 results for T.W. Hickmott
Thermally stimulated ionic conductivity of sodium in thermal SiO 2
- T.W. Hickmott
- 2008
- Journal of Applied Physics
Annealing of surface states in polycrystalline-silicon-gate capacitors
- T.W. Hickmott
- 2008
- Journal of Applied Physics
Charge injection from polycrystalline silicon into SiO2 at low fields
- B.H. Yun
- T.W. Hickmott
- 2008
- Journal of Applied Physics
Temperature dependence of the relaxation of injected charge at the polycrystalline-silicon-SiO2 interface
- T.W. Hickmott
- 2008
- Journal of Applied Physics
Stoichiometry and atomic defects in rf-sputtered SiO2
- T.W. Hickmott
- J.E.E. Baglin
- 2008
- Journal of Applied Physics
Dipole layers at the metal-SiO2 interface
- T.W. Hickmott
- 2008
- Journal of Applied Physics
The use of thermally stimulated ionic currents with a hyperbolic heating rate to measure sodium motion in rf-sputtered SiO2 films
- T.W. Hickmott
- 2003
- Applied Physics Letters
Defect centers in oxygen-deficient rf-sputtered SiO2 films. II. Thermoluminescence
- T.W. Hickmott
- 2003
- Journal of Applied Physics
Defect centers in oxygen-deficient rf-sputtered SiO2 films. I. Electron spin resonance
- T.W. Hickmott
- 2003
- Journal of Applied Physics