Thermal and electromigration-induced strains in copper conductor lines: X-ray microbeam measurements and analysis
- G. Wang
- H. Zhang
- et al.
- 2006
- MRS Spring Meeting 2006
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35 results for G.S. Cargill
Local and global stress distributions in BEOL metallization
- I.C. Noyan
- E. Liniger
- et al.
- 1996
- MRS Spring Meeting 1996
Electrochemical experiments in cold nuclear fusion
- J.F. Ziegler
- T.H. Zabel
- et al.
- 1989
- Physical Review Letters
Lattice compression from conduction electrons in heavily doped Si:as
- G.S. Cargill III
- J. Angilello III
- et al.
- 1988
- Physical Review Letters
Annealing of heavily arsenic-doped silicon: Electrical deactivation and a new defect complex
- K.C. Pandey
- A. Erbil
- et al.
- 1988
- Physical Review Letters
Large anisotropic vibrational correlations in A15 Nb3Ge
- G.S. Cargill III
- R.F. Boehme
- et al.
- 1983
- Physical Review Letters
Evidence for pseudo bridge bonding of c(2×2)-O on Ni(100)
- J.E. Demuth
- N.J. Dinardo
- et al.
- 1983
- Physical Review Letters
Ultrasonic imaging in scanning electron microscopy
- G.S. Cargill
- 1980
- Nature
Thermal and electromigration-induced strains in polycrystalline films and conductor lines: X-ray microbeam measurements and analysis
- G.S. Cargill III
- L.E. Moyer
- et al.
- 2005
- International Workshop on Stress-Induced Phenomena in Metallization 2005
In-situ x-ray microbeam Cu fluorescence and strain measurements on Al(0.5 at.% Cu) conductor lines during electromigration
- H.K. Kao
- G.S. Cargill III
- et al.
- 1999
- Materials Research Society Symposium - Proceedings