Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction
- Judson R. Holt
- Anita Madan
- et al.
- 2013
- Journal of Applied Physics
Publications
Date
Featured collections
Popular topics
2355 results at Journal of Applied Physics
Extended X-ray absorption fine structure spectroscopy of selenium-hyperdoped silicon
- Bonna K. Newman
- Elif Ertekin
- et al.
- 2013
- Journal of Applied Physics
Supersaturating silicon with transition metals by ion implantation and pulsed laser melting
- Daniel Recht
- Matthew J. Smith
- et al.
- 2013
- Journal of Applied Physics
Minority carrier diffusion length extraction in Cu2ZnSn(Se,S) 4 solar cells
- Tayfun Gokmen
- Oki Gunawan
- et al.
- 2013
- Journal of Applied Physics
Dielectric-environment mediated quantum screening of two-dimensional electron gas
- Aniruddha Konar
- Mohit Bajaj
- et al.
- 2013
- Journal of Applied Physics
The effects of plasma exposure and vacuum ultraviolet irradiation on photopatternable low-k dielectric materials
- M.T. Nichols
- K. Mavrakakis
- et al.
- 2013
- Journal of Applied Physics
Feasibility of an active-read approach for spin-torque switched magnetic tunnel junctions in a random access memory
- Jonathan Z. Sun
- John Debrosse
- et al.
- 2013
- Journal of Applied Physics
Effect of dual gate control on the alternating current performance of graphene radio frequency device
- Wenjuan Zhu
- Tony Low
- et al.
- 2013
- Journal of Applied Physics
Role of point defects and HfO2/TiN interface stoichiometry on effective work function modulation in ultra-scaled complementary metal-oxide-semiconductor devices
- Rajan K. Pandey
- Rajesh Sathiyanarayanan
- et al.
- 2013
- Journal of Applied Physics
Quasi-equilibrium size distribution of subcritical nuclei in amorphous phase change AgIn-Sb2Te
- Kristof Darmawikarta
- Bong-Sub Lee
- et al.
- 2013
- Journal of Applied Physics