Interface state density of single vertical nanowire MOS capacitors
- Philipp Mensch
- Kirsten E. Moselund
- et al.
- 2013
- IEEE TNANO
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Finite-element-based generalized impedance boundary condition for modeling plasmonic nanostructures
- Shiquan He
- Wei E.I. Sha
- et al.
- 2012
- IEEE TNANO
Vapor-solid-solid growth of NiSi2 nanocrystals for memory application
- Bei Li
- Jianlin Liu
- et al.
- 2011
- IEEE TNANO
Layer number determination and thickness-dependent properties of graphene grown on SiC
- Wenjuan Zhu
- Christos Dimitrakopoulos
- et al.
- 2011
- IEEE TNANO
Corner effect and local volume inversion in SiNW FETs
- Luca De Michielis
- Kirsten Emilie Moselund
- et al.
- 2011
- IEEE TNANO
Scanning thermal microscopy for fast multiscale imaging and manipulation
- Rachel J. Cannara
- Abu Sebastian
- et al.
- 2010
- IEEE TNANO
FinFET design for tolerance to statistical dopant fluctuations
- Vidya Varadarajan
- Lee Smith
- et al.
- 2009
- IEEE TNANO
Measuring frequency response of a single-walled carbon nanotube common-source amplifier
- Islamshah Amlani
- King F. Lee
- et al.
- 2009
- IEEE TNANO
A three-terminal approach to developing spin-torque written magnetic random access memory cells
- Patrick M. Braganca
- Jordan A. Katine
- et al.
- 2009
- IEEE TNANO
Nanoscale PtSi tips for conducting probe technologies
- Harish Bhaskaran
- Abu Sebastian
- et al.
- 2009
- IEEE TNANO