Topology of Silicon Structures with Recessed SiO2
- E. Bassous
- H.N. Yu
- et al.
- 2019
- JES
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Silicon Oxidation Studies: Analysis of SiO2 Film Growth Data
- E.A. Irene
- Y.J. van der Meulen
- 2019
- JES
Poly(Methyl Methacrylate-isobutylene) Copolymers as Highly Sensitive Electron Beam Resists
- Edward Gipstein
- Wayne Moreau
- et al.
- 2019
- JES
Electrical and EPR Studies of Electrolytically Grown TiO2 (Rutile)
- G.V. Chandrashekhar
- R.S. Title
- 2019
- JES
Raman Scattering Spectroscopy Applied to the Study of Chemical Vapor Deposition Systems
- T.O. Sedgwick
- J.E. Smith
- 2019
- JES
Ionic Conductivity of Monocrystals of the Gallium Analogs of β- and/β′-Alumina
- G.V. Chandrashekhar
- L.M. Foster
- 2019
- JES
Photoelectrolysis of Water with Semiconductor Materials
- Micha Tomkiewicz
- Jerry M. Woodall
- 2019
- JES
Reaction of the Gallium Analog of B″-Alumina with Water
- L.M. Foster
- G.V. Arbach
- 2019
- JES
Pulsed Potentiostatic Deposition of Gold from Solutions of the Au(I) Sulfite Complex
- Jean Horkans
- L. Romankiw
- 2019
- JES
Effect of Orientation, Composition, and Electronic Factors in the Reduction of O2 on Single Crystal Electrodes of the Conducting Oxides of Molybdenum and Tungsten
- Jean Horkans
- M.W. Shafer
- 2019
- JES