Properties preserved under recursion removalH.R. StrongS.A. Walker1972ACM Conference on Proving Assertions about Programs 1972
Fracture of brittle epitaxial films under the influence of misfit stressJ.W. MatthewsE. Klokholm1972Materials Research Bulletin
A note comparing the root condition and the resolvent conditionW.L. MirankerM. Goldberg1972Information Sciences
Large-scale numerical simulation in semiconductor device modellingM. Reiser1972Comput. Methods Appl. Mech. Eng.
Analysis of ultrathin oxide growth on indiumJ.M. EldridgeY.J. Van der Meulenet al.1972Thin Solid Films
An autoradiographic investigation of material transfer and wear during high speed/low load slidingF.E. Talke1972Wear