Strain engineering for fully-depleted SOI devicesAli KhakifiroozPranita Kulkarniet al.2010ECS Transactions
Oxygen transport in high-κ/ metal gate stacks and physical characterization by SIMS using isotope labeled oxygenMarinus HopstakenJohn Bruleyet al.2010ECS Transactions
Methodology of ALD HfO2 high-κ gate dielectric optimization by cyclic depositions and annealsH. JagannathanRobert D. Clarket al.2010ECS Transactions