Publications

64 results at IEEE TNS

Pion-induced soft upsets in 16 Mbit DRAM chips
- - C.J. Gelderloos
  - R.J. Peterson
  - et al.
- 1997
- IEEE TNS
Interface Defect Formation in MOSFETs by Atomic Hydrogen Exposure
- - R.E. Stahlbush
  - E. Cartier
- 1994
- IEEE TNS
Ion Microbeam Radiation System
- - D. Heidel
  - U. Bapst
  - et al.
- 1993
- IEEE TNS
An intense pulsed barium ion source
- - J.M. Neri
  - D.A. Hammer
  - et al.
- 1981
- IEEE TNS
A hardened field insulator
- - G.J. Hu
  - J.M. Aitken
  - et al.
- 1981
- IEEE TNS
The gsi data acquisition system (EDAS)
- - Otto Siart
  - Ruth Thieme
  - et al.
- 1979
- IEEE TNS
Avalanche injection of holes into SiO2
- - J.M. Aitken
  - D.R. Young
- 1977
- IEEE TNS
Electron injection studies of radiation induced positive charge in MOS devices
- - J.M. Aitken
  - D.J. DiMaria
  - et al.
- 1976
- IEEE TNS
A time shared system for multiple independent laboratories
- - J. Birnbaum
- 1971
- IEEE TNS
On the merits of interface standardization: A round table discussion
- - Charles.D Goodman
  - Tom Droege
  - et al.
- 1970
- IEEE TNS