Simple polysilicon thin film transistor structure for achieving high on/off current ratio independent of gate bias
- Jerzy Kanicki
- M.K. Hatalis
- 1992
- SSDM 1992
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5 results at SSDM 1992
Understanding of enhanced sensitivity to Hot Carrier degradation in drain engineered n-FETs
- C.C.-H. Hsu
- B.S. Wu
- et al.
- 1992
- SSDM 1992
Fabrication and measurements of ultra-short silicon MOSFETs
- A. Hartstein
- 1992
- SSDM 1992
Nitrogen dangling bonds in hydrogenated amorphous silicon nitride thin films
- Jerzy Kanicki
- W.L. Warren
- et al.
- 1992
- SSDM 1992
Bias-stress-induced stretched-exponential time dependence of charge injection and trapping in amorphous silicon thin-film transistors
- Frank R. Libsch
- Jerzy Kanicki
- 1992
- SSDM 1992