Publications

13 results at IEDM 2012

Electromigration extendibility of Cu(Mn) alloy-seed interconnects, and understanding the fundamentals
- - Takeshi Nogami
  - C. Penny
  - et al.
- 2012
- IEDM 2012
22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL
- - S. Narasimha
  - P. Chang
  - et al.
- 2012
- IEDM 2012
Temperature dependence of TDDB voltage acceleration in high-κ/ SiO₂ bilayers and SiO₂ gate dielectrics
- - Ernest Wu
  - Jordi Suñé
  - et al.
- 2012
- IEDM 2012
An integration path for gate-first UTB III-V-on-insulator MOSFETs with silicon, using direct wafer bonding and donor wafer recycling
- - Lukas Czornomaz
  - N. Daix
  - et al.
- 2012
- IEDM 2012
InAs-Si heterojunction nanowire tunnel diodes and tunnel FETs
- - Heike Riel
  - K. Moselund
  - et al.
- 2012
- IEDM 2012
A 90nm CMOS integrated Nano-Photonics technology for 25Gbps WDM optical communications applications
- - Solomon Assefa
  - Steven Shank
  - et al.
- 2012
- IEDM 2012
Room-temperature carrier transport in high-performance short-channel Silicon nanowire MOSFETs
- - Amlan Majumdar
  - Sarunya Bangsaruntip
  - et al.
- 2012
- IEDM 2012
Advanced flexible CMOS integrated circuits on plastic enabled by controlled spalling technology
- - Davood Shahrjerdi
  - Stephen W. Bedell
  - et al.
- 2012
- IEDM 2012
High mobility high-κ-all-around asymmetrically-strained Germanium nanowire trigate p-MOSFETs
- - Winston Chern
  - Pouya Hashemi
  - et al.
- 2012
- IEDM 2012
Sub-30nm scaling and high-speed operation of fully-confined Access-Devices for 3D crosspoint memory based on mixed-ionic-electronic-conduction (MIEC) materials
- - K. Virwani
  - G.W. Burr
  - et al.
- 2012
- IEDM 2012