Conference paper
Past, present, and future of backscatter electron (BSE) imaging
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution. © 2010 IEEE.
Oliver C. Wells, Michael S. Gordon, et al.
ScMi 2012
Keith A. Jenkins, Anup P. Jose, et al.
ESSCIRC 2005
Nathaniel A. Dodds, James R. Schwank, et al.
IEEE TNS
Nathaniel A. Dodds, James R. Schwank, et al.
IEEE TNS