Technologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Publications
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30 results for H. Tang
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Stacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
Inverse kinematics studies of intermediate-energy reactions relevant for SEE and medical problems
- J. Aichelin
- Ch. Bargholtz
- et al.
- 2004
- ND 2004
Soft error rate scaling for emerging SOI technology options
- P. Oldiges
- K. Bernstein
- et al.
- 2002
- VLSI Technology 2002
Single-event upsets in microelectronics
- Henry H.K. Tang
- Nils Olsson
- 2003
- MRS Bulletin
Anthology of the development of radiation transport tools as applied to single event effects
- R.A. Reed
- R.A. Weller
- et al.
- 2013
- IEEE TNS
Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS