Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Review
Driving force in electromigration and the residual resistivity field-A reply
Abstract
This is a reply to a Comment by Turban and Gerl. © 1976 The American Physical Society.
Related
K.N. Tu
Materials Science and Engineering: A
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
J. Tersoff
Applied Surface Science