Driving force in electromigration and the residual resistivity field-A reply

Elizabeth A. Sholler, Frederick M. Meyer, et al.

SPIE AeroSense 1997

T. Schneider, E. Stoll

Physical Review B

E. Babich, J. Paraszczak, et al.

Microelectronic Engineering

R.J. Gambino, N.R. Stemple, et al.

Journal of Physics and Chemistry of Solids