C.-K. Hu, L. Gignac, et al.
Microelectronics Reliability
C.-K. Hu, L. Gignac, et al.
Microelectronics Reliability
Y.-H. Kim, C. Cabral Jr., et al.
VLSI-TSA 2006
P. DeHaven, K.P. Rodbell, et al.
MRS Spring Meeting 1999
Anthony K. Stamper, H. Baks, et al.
AMC 2005