Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
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Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security
- Franco Stellari
- Peilin Song
- 2022
- IEEE ITC 2022
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2022
- ESSDERC 2022
Photon Emission Microscopy of Amorphous HfO2 ReRAM Cells
- Franco Stellari
- Leonidas E. Ocola
- et al.
- 2022
- IPFA 2022
Gibbs spatial process for characterization of filament interaction in ReRAM devices via photon emission microscopy
- Ernest Wu
- Franco Stellari
- et al.
- 2022
- Applied Physics Letters
Resistive Random Access Memory Filament Visualization and Characterization Using Photon Emission Microscopy
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2021
- IEEE Electron Device Letters
1D and 2D Time-Resolved Emission Measurements of Circuits Fabricated in 14 nm Technology Node
- Franco Stellari
- Andrea Bahgat Shehata
- et al.
- 2020
- IPFA 2020
AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress
- Cyril Cabral
- Robert B. Laibowitz
- et al.
- 2020
- Microelectronic Engineering
Humidity Penetration Impact on Integrated Circuit Performance and Reliability
- Franco Stellari
- Cyril Cabral
- et al.
- 2019
- IEDM 2019
Case Study of Advanced Diagnostic Techniques for Multi Port Register File
- Uma Srinivasan
- William Huott
- et al.
- 2019
- NATW 2019