Conference paperMeasurements of inter-and-intra device transient thermal transport on SOI FETsP. Solomon, M. Shamsa, et al.IEDM 2007
PaperThermodynamics of a charged fermion layer at high rs valuesS. Shapira, U. Sivan, et al.Physical Review Letters
Conference paperExperimental and theoretical explanation for the orientation dependence gate-induced drain leakage in scaled MOSFETsP. Solomon, S.E. Laux, et al.DRC 2009
PaperCharacterization of the silicon on insulator film in bonded wafers by high resolution X-ray diffractionG.M. Cohen, P.M. Mooney, et al.Applied Physics Letters
