IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons

George A. Sai-Halasz, Matthew R. Wordeman, et al.

IEEE Electron Device Letters

Osamu Takahashi, Sang H. Dhong, et al.

IEEE Journal of Solid-State Circuits

Toshiaki Kirihata, Yohji Watanabe, et al.

IEICE Transactions on Electronics

George A. Sai-Halasz, Matthew R. Wordeman, et al.

IEEE Journal of Solid-State Circuits