PaperA Fully Scaled Submicrometer NMOS Technology Using Direct-Write E-Beam LithographyMatthew R. Wordeman, April M. Schweighart, et al.IEEE T-ED
PaperElectron states in a GaAs quantum dot in a magnetic fieldArvind Kumar, Steven E. Laux, et al.Physical Review B
PaperIIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot ElectronsJack Y. C. Sun, Matthew R. WordemanIEEE T-ED
PaperOn the Accuracy of Channel Length Characterization of LDD MOSFET'sJack Y.-C. Sun, Matthew R. Wordeman, et al.IEEE T-ED
