Yu-Ming Lin, Damon B. Farmer, et al.
IEEE Electron Device Letters
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Yu-Ming Lin, Damon B. Farmer, et al.
IEEE Electron Device Letters
J. Cai, Tak H. Ning, et al.
S3S 2013
Keith A. Jenkins
Scanning
Keith A. Jenkins, Barry P. Linder
IEEE Electron Device Letters