PaperFrequency Response of Bipolar Junction Transistors after Electron-Beam irradiationKeith A. JenkinsIEEE T-ED
PaperElectron-Beam Damage of Self-Aligned Silicon Bipolar Transistors and CircuitsKeith A. Jenkins, John D. CresslerIEEE T-ED
Conference paperStatistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structureSaibal Mukhopadhyay, Keunwoo Kim, et al.ISSCC 2007