PaperPerformance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillatorChih-Hsiang Ho, Keith A. Jenkins, et al.IEEE T-ED
PaperMicrowave inductors and capacitors in standard multilevel interconnect silicon technologyJoachim N. Burghartz, Mehmet Soyuer, et al.IEEE T-MTT
Conference paperA scalable, digital BIST circuit for measurement and compensation of static phase offsetKeith A. Jenkins, Lionel LiVTS 2009