Sandip Kundu
IEEE Transactions on VLSI Systems
This paper considers the design of binary Mock codes that are capable of correcting up to t symmetric errors and detecting all unidirectional errors. A class of systematic t-symmetric-error-correcting/all-unidirectional-error-detecting (t-SyEC/AUED) codes are proposed. When t = 0 the proposed codes become Berger codes. For t = 1, the proposed codes are shown to be of “asymptotically optimal order.” Methods to construct nonsystematic t-SyEC/AUED codes for t = 2 and 3 are also presented in this paper. © 1990 IEEE
Sandip Kundu
IEEE Transactions on VLSI Systems
Sandip Kundu, Sudhakar M. Reddy
IEEE Design and Test of Computers
Sandip Kundu, Uttam Ghoshal
EDTC 1997
Sandip Kundu
Integration, the VLSI Journal