Conference paper
Roughness analysis of Si1-xGex films
R.M. Feenstra, M.A. Lutz, et al.
MRS Fall Meeting 1994
The physical and electrical properties of thin layers of AlN were studied in Al-gated MOS capacitors and long channel MOSFETs. It was found that devices with close to ideal hf C-V characteristics can be achieved with growth and anneal temperatures at 650°C. The results showed that the leakage current of the AlN was up to five orders of magnitude lower than for SiO2 of equivalent thickness.
R.M. Feenstra, M.A. Lutz, et al.
MRS Fall Meeting 1994
V. Narayanan, S. Guha, et al.
Applied Physics Letters
M. Copel, J.D. Baniecki, et al.
Applied Physics Letters
M. Copel, R.M. Tromp
Surface Science