Ravi F. Saraf, Steve Ostrander, et al.
Langmuir
Scanning tunneling microscopy is used to confirm the -bonded chain structure of the Si(111)2×1 surface. Both the amplitude and voltage dependence of the vertical corrugation exclude the buckling model for the structure of this surface. Spectroscopic measurements of the tunneling current versus voltage identify a band gap for the 2×1 surface states. Spatial images of disorder-related states are obtained by tunneling at energies inside of this band gap. © 1986 The American Physical Society.
Ravi F. Saraf, Steve Ostrander, et al.
Langmuir
A.P. Fein, J.R. Kirtley, et al.
Physical Review B
C.K. Shih, Efthimios Kaxiras, et al.
Physical Review B
R.M. Feenstra, G.S. Oehrlein
Applied Physics Letters