Conference paper
Revealing SRAM memory content using spontaneous photon emission
Franco Stellari, Peilin Song, et al.
VTS 2016
Near InfraRed (NIR) photon emission is observed from filaments in HfO2 Resistive Random Access Memories (ReRAMs). This technique is non-destructive and offers rapid localization of filaments, enabling statistical analysis of their spatial distribution. We show that the emission is electric-field driven. We also report direct experimental evidence of ) completely random spatial distribution of filaments across multiple devices and ii) formation of multiple filaments inside a single large device.
Franco Stellari, Peilin Song, et al.
VTS 2016
Pouya Hashemi, Takashi Ando, et al.
VLSI-TSA 2017
Ernest Wu, Takashi Ando, et al.
IEDM 2019
Franco Stellari, Ernest Y. Wu, et al.
ESSDERC 2022