Wen Liu, Ernest Y. Wu, et al.
IRPS 2016
Near InfraRed (NIR) photon emission is observed from filaments in HfO2 Resistive Random Access Memories (ReRAMs). This technique is non-destructive and offers rapid localization of filaments, enabling statistical analysis of their spatial distribution. We show that the emission is electric-field driven. We also report direct experimental evidence of ) completely random spatial distribution of filaments across multiple devices and ii) formation of multiple filaments inside a single large device.
Wen Liu, Ernest Y. Wu, et al.
IRPS 2016
Ernest Wu, Takashi Ando, et al.
IRPS 2024
Alan J. Weger, Franco Stellari, et al.
ISTFA 2017
Takashi Ando, Eduard Cartier, et al.
IEDM 2016