S. Kodambaka, J.B. Hannon, et al.
M&M 2006
Solid solutions of CoSi2 and NiSi2 were prepared from the solid-state reaction of thin films of Ni-Co alloys with their silicon substrates. The room-temperature resistivity of these silicide solid solutions does not increase parabolically, but (within the sensitivity of the measurements) varies linearly with composition. A model is proposed which explains the very weak alloy scattering on the basis that in these disilicides (a) the d bands are pushed below the Fermi level, (b) conduction occurs mostly via s electrons, and (c) there is no s-d scattering.
S. Kodambaka, J.B. Hannon, et al.
M&M 2006
J. Tersoff
Physical Review B
T.G. Finstad, O. Thomas, et al.
Applied Surface Science
Vasili Perebeinos, J. Tersoff, et al.
Physical Review Letters