Summary Abstract: The origin of oxidation induced enhancement of Si⁺ sputter yield in SIMS

Mark W. Dowley

Solid State Communications

J.V. Harzer, B. Hillebrands, et al.

Journal of Magnetism and Magnetic Materials

I.K. Pour, D.J. Krajnovich, et al.

SPIE Optical Materials for High Average Power Lasers 1992

Heinz Schmid, Hans Biebuyck, et al.

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures