PaperSpecimen replication for electron microscopy using x rays and x-ray resistRalph Feder, David Sayre, et al.Journal of Applied Physics
PaperFabrication and testing of large area multilayer coated x-ray opticsEberhard Spiller, Leon GolubApplied Optics
Conference paperTwo normal incidence collimators designed for the calibration of the extreme ultraviolet explorerSharon R. Jelinsky, Barry Welsh, et al.Proceedings of SPIE 1989