FINFET technology featuring high mobility SiGe channel for 10nm and beyond
- Dechao Guo
- G. Karve
- et al.
- 2016
- VLSI Technology 2016
Publications
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86 results for Phil Oldiges
Toward ultimate scaling of MOSFET
- Ramachandran Muralidhar
- Isaac Lauer
- et al.
- 2016
- IEEE T-ED
Vertical Slit FET at 7-nm Node and beyond
- Ping-Lin Yang
- Terence B. Hook
- et al.
- 2016
- IEEE T-ED
Total ionizing dose radiation effects on 14 nm FinFET and SOI UTBB technologies
- Harold Hughes
- Patrick McMarr
- et al.
- 2015
- REDW/NSREC 2015
Performance trade-offs in FinFET and gate-all-around device architectures for 7nm-node and beyond
- Seong-Dong Kim
- Michael Guillorn
- et al.
- 2015
- S3S 2015
A novel ALD SiBCN low-k spacer for parasitic capacitance reduction in FinFETs
- Tenko Yamashita
- S. Mehta
- et al.
- 2015
- VLSI Technology 2015
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Hybrid methodology to model random dopant fluctuations in low doped FinFETs
- Samarth Agarwal
- Jeffrey B. Johnson
- et al.
- 2015
- Journal of Computational Electronics
Super fast physics-based methodology for accurate memory yield prediction
- Rajiv V. Joshi
- Keunwoo Kim
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2014
- IEEE T-ED