Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
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16 results for Steven H. Voldman
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology
- Steven H. Voldman
- Brian Ronan
- et al.
- 2002
- EOS/ESD 2002
Silicon Germanium heterojunction bipolar transistor ESD power clamps and the Johnson Limit
- Steven H. Voldman
- Alan Botula
- et al.
- 2001
- EOS/ESD 2001
Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry
- S. Voldman
- D. Hui
- et al.
- 2000
- EOS/ESD 2000
Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors
- S. Voldman
- P. Juliano
- et al.
- 2000
- EOS/ESD 2000
Electrostatic discharge (ESD) protection in silicon-on-insulator (SOI) CMOS technology with aluminum and copper interconnects in advanced microprocessor semiconductor chips
- S. Voldman
- D. Hui
- et al.
- 1999
- EOS/ESD 1999
Electrostatic discharge protection in silicon-on-insulator technology
- S. Voldman
- D. Hui
- et al.
- 1999
- IEEE International SOI Conference 1999
State of the art of electrostatic discharge protection: Physics, technology, circuits, design, simulation and scaling
- S. Voldman
- 1998
- BCTM 1998
Latchup in CMOS technology
- M. Hargrove
- S. Voldman
- et al.
- 1998
- IRPS 1998