Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry
- S. Voldman
- D. Hui
- et al.
- 2000
- EOS/ESD 2000
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6 results for J. Howard
Electrostatic discharge (ESD) protection in silicon-on-insulator (SOI) CMOS technology with aluminum and copper interconnects in advanced microprocessor semiconductor chips
- S. Voldman
- D. Hui
- et al.
- 1999
- EOS/ESD 1999
Electrostatic discharge protection in silicon-on-insulator technology
- S. Voldman
- D. Hui
- et al.
- 1999
- IEEE International SOI Conference 1999
Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry
- S. Voldman
- D. Hui
- et al.
- 2002
- Journal of Electrostatics
Electrostatic discharge (ESD) protection in silicon-on-insulator (SOI) CMOS technology with aluminum and copper interconnects in advanced microprocessor semiconductor chips
- S. Voldman
- D. Hui
- et al.
- 2000
- Journal of Electrostatics
CMOS-on-SOI ESD protection networks
- S. Voldman
- R. Schulz
- et al.
- 1998
- Journal of Electrostatics