Measurement of VLSI Power Supply Current by Electron-Beam Probing
- Keith A. Jenkins
- Robert L. Franch
- 1992
- IEEE Journal of Solid-State Circuits
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Use of electron-beam charging for in-process inspection of silicide complementary metal-oxide-semiconductor gate electrode isolation
- Keith A. Jenkins
- P. Agnello
- et al.
- 1992
- Applied Physics Letters
Use of voltage contrast to locate defects in patterned high-Tc films
- Keith A. Jenkins
- Byungdu Oh
- 1991
- Journal of Applied Physics
Device design issues for a high-performance technology with Si or SiGe epitaxial base
- J.N. Burghartz
- J.D. Cressler
- et al.
- 1991
- Microelectronic Engineering
Electron beam tester measurements of switching noise in VLSI circuits
- Keith A. Jenkins
- David F. Heidel
- 1991
- Microelectronic Engineering
Corroborating Cutoff Frequency Measurements with DC Gain Measurements
- Keith A. Jenkins
- 1991
- IEEE Trans. Instrum. Meas.
Electron-Beam Damage of Self-Aligned Silicon Bipolar Transistors and Circuits
- Keith A. Jenkins
- John D. Cressler
- 1991
- IEEE T-ED
The Design and Optimization of High-Performance, Double-Poly Self-Aligned p-n-p Technology
- Pong-Fei Lu
- James D. Warnock
- et al.
- 1991
- IEEE T-ED
Ion Microbeam Probing of Sense Amplifiers to Analyze Single Event Upsets in a CMOS DRAM
- Linda M. Geppert
- David F. Heidel
- et al.
- 1991
- IEEE Journal of Solid-State Circuits
Internal Node Probing of a DRAM with a Low-Temperature e-Beam Tester
- Keith A. Jenkins
- Walter H. Henkels
- 1991
- IEEE Journal of Solid-State Circuits