Statistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structure
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- ISSCC 2007
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30 results for Saibal Mukhopadhyay
Optimal UTB FD/SOI device structure using thin BOX for sub-50-nm SRAM design
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Electron Device Letters
Impact of die-to-die thermal coupling on the electrical characteristics of 3D stacked SRAM cache
- Subho Chatterjee
- Minki Cho
- et al.
- 2012
- SEMI-THERM 2012
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2008
- ICICDT 2008
Capacitive coupling based transient negative bit-line voltage (tran-NBL) scheme for improving write-ability of SRAM design in nanometer technologies
- S. Mukhopadhyay
- R.M. Rao
- et al.
- 2008
- ISCAS 2008
Design and analysis of a self-repairing SRAM with on-chip monitor and compensation circuitry
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2008
- VTS 2008
Variability analysis for sub-100nm PD/SOI sense-amplifier
- Saibal Mukhopadhyay
- Rajiv V. Joshi
- et al.
- 2008
- ISQED 2008