Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1989
- Applied Physics Letters
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56 results for H. Kumar Wickramasinghe
Absolute optical ranging with 200-nm resolution
- C.C. Williams
- H.K. Wickramasinghe
- 1989
- Optics Letters
High-resolution capacitance measurement and potentiometry by force microscopy
- Yves Martin
- David W. Abraham
- et al.
- 1988
- Applied Physics Letters
High‐resolution magnetic imaging by force microscopy (invited) (abstract)
- H.K. Wickramasinghe
- Y. Martin
- 1988
- Journal of Applied Physics
High-resolution magnetic imaging of domains in TbFe by force microscopy
- Y. Martin
- D. Rugar
- et al.
- 1988
- Applied Physics Letters
Measurement of in-plane magnetization by force microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters
Noise reduction technique for scanning tunneling microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters
Magnetic imaging by "force microscopy" with 1000 Å resolution
- Y. Martin
- H.K. Wickramasinghe
- 1987
- Applied Physics Letters
Study of dynamic current distribution in logic circuits by Joule displacement microscopy
- Y. Martin
- H.K. Wickramasinghe
- 1987
- Applied Physics Letters
Atomic force microscope-force mapping and profiling on a sub 100-Å scale
- Y. Martin
- C.C. Williams
- et al.
- 1987
- Journal of Applied Physics