Experiment and model for deviation from Pelgrom scaling relation in device width
- Ning Lu
- J. Brown
- et al.
- 2014
- IEDM 2014
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23 results for Ning Lu
Efficient and accurate schematic transistor model of FinFET parasitic elements
- Ning Lu
- Terence B. Hook
- et al.
- 2013
- IEEE Electron Device Letters
Symmetry breaking in the drain current of multi-finger transistors
- Ning Lu
- Sungjae Lee
- et al.
- 2015
- CICC 2015
Modeling of resistance in FinFET local interconnect
- Ning Lu
- Pooja M. Kotecha
- et al.
- 2014
- CICC 2014
Virtual de-embedding study for the accurate extraction of Fin FET gate resistance
- Shireen Warnock
- Rob Groves
- et al.
- 2014
- CICC 2014
Gate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- S. Lee
- et al.
- 2013
- CICC 2013
An efficient and accurate schematic transistor model of FinFET parasitic elements
- Ning Lu
- Terence B. Hook
- et al.
- 2013
- NSTI-Nanotech 2013
Discreteness and distribution of drain currents in FinFETs
- Ning Lu
- 2012
- NSTI-Nanotech 2012
Characterization and modeling of metal finger capacitors
- Ning Lu
- Roger Booth
- et al.
- 2011
- NSTI-Nanotech 2011
Modeling of mismatch and across-chip variations in compact device models
- Ning Lu
- 2010
- Fluidics and Computational -/NSTI-Nanotech 2010