Characterization, simulation, and modeling of FET source/drain diffusion resistanceNing LuBill Dewey2008CICC 2008
Modeling of spatial correlations in process, device, and circuit variationsNing Lu2008NSTI-Nanotech 2008
Characterization, Modeling and Extraction of Cu Wire Resistance for 65 nm TechnologyNing LuM. Angyalet al.2007CICC 2007
Enablement of variation-aware timing: Treatment of parasitic resistance and capacitanceNing LuJudy H. McCullen2007ISQED 2007
Modeling of transistor's tracking behavior in compact modelsNing Lu2011Active and Passive Electronic Components