TCAD/physics-based analysis of high-density dual-BOX FD/SOI SRAM cell with improved stability
- Keunwoo Kim
- Jente B. Kuang
- et al.
- 2009
- IEEE Transactions on Electron Devices
Publications
Date
Featured collections
Popular topics
79 results for Keunwoo Kim
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Selective device structure scaling and parasitics engineering: A way to extend the technology roadmap
- Lan Wei
- Jie Deng
- et al.
- 2009
- IEEE Transactions on Electron Devices
Stable high-density FD/SOI SRAM with selective back-gate bias using dual buried oxide
- Keunwoo Kim
- Jente B. Kuang
- et al.
- 2008
- IEEE International SOI Conference 2008
Circuit techniques utilizing independent gate control in double-gate technologies
- Jente B. Kuang
- Keunwoo Kim
- et al.
- 2008
- IEEE Transactions on VLSI Systems
An on-chip test structure and digital measurement method for statistical characterization of local random variability in a process
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Journal of Solid-State Circuits
Statistical evaluation of split gate opportunities for improved 8T/6T column-decoupled SRAM cell yield
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2008
- ISQED 2008
Variability analysis for sub-100nm PD/SOI sense-amplifier
- Saibal Mukhopadhyay
- Rajiv V. Joshi
- et al.
- 2008
- ISQED 2008
Extending technology roadmap by selective device footprint scaling and parasitics engineering
- Jie Deng
- Lan Wei
- et al.
- 2008
- VLSI-TSA 2008
Optimal design of triple-gate devices for high-performance and low-power applications
- Meng-Hsueh Chiang
- Jeng-Nan Lin
- et al.
- 2008
- IEEE Transactions on Electron Devices