Statistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structure
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- ISSCC 2007
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79 results for Keunwoo Kim
Self-consistent and efficient electro-thermal analysis for poly/metal gate FinFETs
- Satish Kumar
- Rajiv V. Joshi
- et al.
- 2006
- IEDM 2006
Optimal UTB FD/SOI device structure using thin BOX for sub-50-nm SRAM design
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2006
- IEEE Electron Device Letters
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Impact of FinFET technology for power gating in nano-scale design
- Keunwoo Kim
- Rouwaida Kanj
- et al.
- 2014
- ISQED 2014
A high-density SRAM design technique using silicon nanowire FETs
- Yi-Bo Liao
- Meng-Hsueh Chiang
- et al.
- 2011
- LISS 2011
Variability study of silicon nanowire FETs
- Yi-Bo Liao
- Meng-Hsueh Chiang
- et al.
- 2011
- NSTI-Nanotech 2011
High-performance ultra-low power junctionless nanowire FET on SOI substrate in subthreshold logic application
- Chun-Yu Chen
- Jyi-Tsong Lin
- et al.
- 2010
- IEEE International SOI Conference 2010
Technology-circuit co-design of asymmetric SRAM cells for read stability improvement
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2010
- CICC 2010
FinFET SRAM design
- Rajiv Joshi
- Keunwoo Kim
- et al.
- 2010
- VLSID/Embedded 2010