Roughness analysis of Si1-xGex films
- R.M. Feenstra
- M.A. Lutz
- et al.
- 1994
- MRS Fall Meeting 1994
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150 results for Matthew Copel
Direct measurement of the growth mode of graphene on SiC(0001) and SiC(0001̄)
- James B. Hannon
- Matthew Copel
- et al.
- 2011
- Physical Review Letters
Maximized benefit of LaAlO higher-κ gate dielectrics by optimizing the La/Al atomic ratio
- Hiroaki Arimura
- Stephen L. Brown
- et al.
- 2011
- IEEE Electron Device Letters
High-mobility p-type transistor based on a spin-coated metal telluride semiconductor
- David B. Mitzi
- Matthew Copel
- et al.
- 2006
- Advanced Materials
Low-voltage transistor employing a high-mobility spin-coated chalcogenide semiconductor
- David B. Mitzi
- Matthew Copel
- et al.
- 2005
- Advanced Materials
Critical role of surface steps in the alloying of Ge on Si(001)
- J.B. Hannon
- M. Copel
- et al.
- 2004
- Physical Review Letters
High-mobility ultrathin semiconducting films prepared by spin coating
- David B. Mitzi
- Laura L. Kosbar
- et al.
- 2004
- Nature
Symmetry, structure, and step induced ordering of the Si(001)-(2 × 3)Ag surface
- Thomas Michely
- Mark C. Reuter
- et al.
- 1994
- Physical Review Letters
Interstitial precursor to silicide formation on Si(111)-(7×7)
- P.A. Bennett
- David G. Cahill
- et al.
- 1994
- Physical Review Letters
H coverage dependence of Si(001) homoepitaxy
- M. Copel
- R.M. Tromp
- 1994
- Physical Review Letters