SEMM-2: A new generation of single-event-effect modeling tools
- Henry H.K. Tang
- 2008
- IBM J. Res. Dev
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30 results for H. Tang
New simulation methodology for effects of radiation in semiconductor chip structures
- Henry H.K. Tang
- Conal E. Murray
- et al.
- 2008
- IBM J. Res. Dev
Alpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
- H. Jäderström
- Yu. Murin
- et al.
- 2008
- Physical Review C - Nuclear Physics
Importance of BEOL modeling in single event effect analysis
- Henry H. K. Tang
- Conal E. Murray
- et al.
- 2007
- IEEE TNS
Low-energy proton-induced single-event-upsets in 65 nm node, silicon-on-insulator, latches and memory cells
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2007
- IEEE TNS
Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS
Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
A detector system for studying nuclear reactions relevant to Single Event Effects
- Yu. Murin
- Yu. Babain
- et al.
- 2007
- Nucl. Instrum. Methods Phys. Res
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS