Physical model of the impact of metal grain work function variability on emerging dual metal gate MOSFETs and its implication for SRAM reliability
- Xiao Zhang
- Jing Li
- et al.
- 2009
- IEDM 2009
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18 results for Y. Nishi
Fermi level depinning at metal-organic semiconductor interface for low-resistance ohmic contacts
- Zihong Liu
- Masaharu Kobayashi
- et al.
- 2009
- IEDM 2009
The effects of plasma exposure on low-k dielectric materials
- J.L. Shohet
- H. Ren
- et al.
- 2012
- SPIE Advanced Lithography 2012
Demonstration of electroluminescence from strained Ge membrane LED
- Donguk Nam
- David Sukhdeo
- et al.
- 2012
- ISTDM 2012
Measurement of bandgap energies in low-k organosilicates
- M.T. Nichols
- Weiyi Li
- et al.
- 2014
- Journal of Applied Physics
Dielectric damage
- H. Ren
- S. Banna
- et al.
- 2014
- ECS Transactions
The effects of vacuum ultraviolet radiation on low-k dielectric films
- H. Sinha
- H. Ren
- et al.
- 2012
- Journal of Applied Physics
Electroluminescence from strained germanium membranes and implications for an efficient Si-compatible laser
- Donguk Nam
- David Sukhdeo
- et al.
- 2012
- Applied Physics Letters
On the high-field transport and uniaxial stress effect in Ge PFETs
- Masaharu Kobayashi
- Jérǒme Mitard
- et al.
- 2011
- IEEE T-ED
Reflectance and substrate currents of dielectric layers under vacuum ultraviolet irradiation
- H. Sinha
- D.B. Straight
- et al.
- 2010
- JVSTA