Mapping of strain fields about thin film structures using x-ray microdiffraction
- C.E. Murray
- I.C. Noyan
- et al.
- 2003
- Applied Physics Letters
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116 results for Conal Murray
Liner materials for direct electrodeposition of Cu
- M.W. Lane
- C.E. Murray
- et al.
- 2003
- Applied Physics Letters
Finite-size effects in thin-film composites
- Conal E. Murray
- I.C. Noyan
- 2002
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Texture inheritance in Al(Cu) interconnect materials
- C.E. Murray
- K.P. Rodbell
- 2001
- Journal of Applied Physics
A modified voigt method for calculation of the elastic constants of ensembles selected by diffraction methods
- Conal E. Murray
- I.C. Noyan
- 1999
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
The relationship between the golden section <z> and the elastic constants of ensembles selected by diffraction methods
- Conal E. Murray
- I.C. Noyan
- 1996
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties