High-mobility ultrathin semiconducting films prepared by spin coating
- David B. Mitzi
- Laura L. Kosbar
- et al.
- 2004
- Nature
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116 results for Conal Murray
High-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Circuits 2013
High-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Technology 2013
A next-generation in-situ nanoprobe beamline for the advanced photon source
- Jörg Maser
- Barry Lai
- et al.
- 2013
- SPIE Optical Engineering + Applications 2013
Probing strained semiconductor structures with nanoscale x-ray diffraction
- 2011
- SEM Annual Conference on Experimental and Applied Mechanics 2011
Evolution of stress gradients in Cu thin films induced by capping layers
- 2010
- ADMETA 2010
Three-dimensional atom-probe tomographic studies of nickel monosilicide/silicon interfaces on a subnanometer scale
- Praneet Adusumilli
- Conal E. Murray
- et al.
- 2009
- ECS Meeting 2009
Silicide challenges for 22nm technologies and beyond
- Paul R. Besser
- Christian Lavoie
- et al.
- 2008
- ECS Meeting 2008
Material and integration issues for rare-Earth Silicides as gate and diffusion contacts in advanced CMOS
- C. D'Emic
- K. Ohuchi
- et al.
- 2008
- ECS Meeting 2008
Extendibility of NiPt silicide to the 22-nm node CMOS technology
- Kazuya Ohuchi
- Christian Lavoie
- et al.
- 2008
- IWJT 2008