Double spin-torque magnetic tunnel junction devices for last-level cache applicationsG. HuC. Safranskiet al.2022IEDM 2022
Reliable Sub-nanosecond MRAM with Double Spin-torque Magnetic Tunnel JunctionsC. SafranskiG. Huet al.2022VLSI Technology and Circuits 2022
Demonstration of narrow switching distributions in STT-MRAM arrays for LLC applications at 1x nm nodeE. R.J. EdwardsGuohan Huet al.2020IEDM 2020
Spin-transfer torque MRAM with reliable 2 ns writing for last level cache applicationsGuohan HuD. Kimet al.2019IEDM 2019
Key parameters affecting STT-MRAM switching efficiency and improved device performance of 400°C-compatible p-MTJsGuohan HuM. G. Gottwaldet al.2017IEDM 2017
Switching distributions and write reliability of perpendicular spin torque MRAMD.C. WorledgeG. Huet al.2010IEDM 2010