Integration of direct plating of Cu onto a CVD Ru liner
- S. Malhotra
- D. Canaperi
- et al.
- 2004
- AMC 2004
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11 results for J.J. Yurkas
Degradation of ultra-thin oxides with Tungsten gates under high voltage: Wear-out and breakdown transient
- F. Palumbo
- S. Lombardo
- et al.
- 2004
- IRPS 2004
Degradation of ultra-thin oxides with tungsten gates under high voltage: Wear-out and breakdown transient
- F. Palumbo
- S. Lombardo
- et al.
- 2004
- IRPS 2004
Low temperature selective area chemical vapor deposition of gold films: Growth and characterization
- P.F. Seidler
- S.P. Kowalczyk
- et al.
- 1992
- MRS Proceedings 1992
Giant piezoresistive On/Off ratios in rare-earth chalcogenide thin films enabling nanomechanical switching
- Matthew Copel
- Marcelo A. Kuroda
- et al.
- 2013
- Nano Letters
A simple in situ method to detect graphene formation at SiC surfaces
- Satoshi Oida
- James B. Hannon
- et al.
- 2011
- Applied Physics Letters
Decoupling graphene from SiC(0001) via oxidation
- Satoshi Oida
- Fenton R. McFeely
- et al.
- 2010
- Physical Review B - CMMP
Reliability of MOS devices with tungsten gates
- F. Palumbo
- S. Lombardo
- et al.
- 2004
- Microelectronic Engineering
Interface studies of tungsten gate metal-oxide-silicon capacitors
- Huiling Shang
- Marvin H. White
- et al.
- 2001
- Applied Physics Letters
Fabrication of midgap metal gates compatible with ultrathin dielectrics
- D.A. Buchanan
- F.R. McFeely
- et al.
- 1998
- Applied Physics Letters