Interconnect material choices for future scaled devices
- Gregory Fritz
- Adam Pyzyna
- et al.
- 2012
- ADMETA 2012
Publications
Date
Featured collections
Popular topics
126 results for Ken Rodbell
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- RADECS 2011
Recent single event effects compendium of candidate electronics for NASA space systems
- Martha V. O'Bryan
- Kenneth A. LaBel
- et al.
- 2011
- REDW/NSREC 2011
FDSOI radiation dosimeters
- Jeng-Bang Yau
- Michael S. Gordon
- et al.
- 2011
- VLSI-TSA 2011
Stacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Metallization opportunities and challenges for future back-end-of-the-line technology
- Cyril Cabral Jr.
- Benjamin Fletcher
- et al.
- 2010
- ADMETA 2010
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2009
- RADECS 2009
Heavy ion testing at the galactic cosmic ray energy peak
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2009
- RADECS 2009
Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007