Surface Plasmon Coupling in Clusters of Small Spheres
- P.E. Batson
- 1982
- Physical Review Letters
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89 results for Philip E. Batson
Extended fine structure on the carbon core-ionization edge obtained from nanometer-sized areas with electron-energy-loss spectroscopy
- P.E. Batson
- A.J. Craven
- 1979
- Physical Review Letters
High resolution EELS in the IBM sub-angstrom STEM
- P.E. Batson
- 2006
- M&M 2006
Materials and process integration issues in metal gate/high-k stacks and their dependence on device performance
- A.C. Callegari
- K. Babich
- et al.
- 2007
- ECS Meeting 2007
Band-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond
- V. Narayanan
- V.K. Paruchuri
- et al.
- 2006
- VLSI Technology 2006
Aberration correction results in the IBM STEM instrument
- P.E. Batson
- 2003
- Ultramicroscopy
Artifacts in aberration-corrected ADF-STEM imaging
- Zhiheng Yu
- Philip E. Batson
- et al.
- 2003
- Ultramicroscopy
Advanced spatially resolved EELS in the STEM
- P.E. Batson
- 1999
- Ultramicroscopy
Symmetry-selected electron energy loss scattering
- P.E. Batson
- 1993
- MSA Annual Meeting 1993
Studies of EELS L2,3 absorption fine structure in thin silicon
- P.E. Batson
- 1991
- Microscopy of Semiconducting Materials 1991