Currents, surface potentials, and defect generation in 1.2-1.5 nm oxide MOSFETs
- S. Tiwari
- J.J. Welser
- et al.
- 1998
- DRC 1998
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119 results for D.J. DiMaria
Degradation of thin SiO 2 gate oxides by atomic hydrogen
- F. Cartier
- D.J. DiMaria
- et al.
- 1994
- DRC 1994
Measurements of hydrogen redistribution in hot electron injection of MOS capacitors
- A.D. Marwick
- D.A. Buchanan
- et al.
- 1992
- MRS Proceedings 1992
Impact ionization, degradation, and breakdown in SiO2
- D.J. Dimaria
- E. Cartier
- et al.
- 1992
- MRS Proceedings 1992
Non-avalanche dielectric breakdown in wide-band-gap insulators at DC and optical frequencies
- P. Braunlich
- S.C. Jones
- et al.
- 1989
- SPIE Laser-Induced Damage in Optical Materials 1989
SPECTROSCOPIC STUDIES OF ELECTRONIC CONDUCTION IN SiO//2 AND Si-RICH SiO//2.
- T.N. Theis
- J.R. Kirtley
- et al.
- 1982
- INFOS 1982
Parameter Dependence of RIE Induced Radiation Damage in Silicon Dioxide
- L.M. Ephrarh
- D.J. Dimaria
- et al.
- 2019
- JES
(Invited) charge trapping in thermal silicon dioxide
- D.J. Dimaria
- 2014
- Japanese Journal of Applied Physics
Hole injection into silicon nitride: Dark current dependence on electrode materials and insulator thickness
- P.C. Arnett
- D.J. DiMaria
- 2008
- Applied Physics Letters
Interface effects and high conductivity in oxides grown from polycrystalline silicon
- D.J. Dimaria
- D.R. Kerr
- 2008
- Applied Physics Letters