Atomic hydrogen-induced degradation of thin SiO2 gate oxides
- E. Cartier
- D.A. Buchanan
- et al.
- 1995
- Journal of Non-Crystalline Solids
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119 results for D.J. DiMaria
Mechanism for stress-induced leakage currents in thin silicon dioxide films
- D.J. Dimaria
- E. Cartier
- 1995
- Journal of Applied Physics
Interface traps induced by hole trapping in metal-oxide semiconductor devices
- Y. Roh
- L.P. Trombetta
- et al.
- 1995
- Journal of Non-Crystalline Solids
Stress induced leakage currents in thin oxides
- D.J. DiMaria
- 1995
- Microelectronic Engineering
Hot-electron-induced hydrogen redistribution and defect generation in metal-oxide-semiconductor capacitors
- D.A. Buchanan
- A.D. Marwick
- et al.
- 1994
- Journal of Applied Physics
Defect generation in 3.5 nm silicon dioxide films
- D.A. Buchanan
- D.J. DiMaria
- et al.
- 1994
- Applied Physics Letters
Theory of high-field electron transport and impact ionization in silicon dioxide
- D. Arnold
- E. Cartier
- et al.
- 1994
- Physical Review B
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
- D.J. DiMaria
- E. Cartier
- et al.
- 1993
- Journal of Applied Physics
Hot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interface
- E. Cartier
- D.J. DiMaria
- 1993
- Microelectronic Engineering
Impact ionization and positive charge formation in silicon dioxide films on silicon
- D.J. DiMaria
- D. Arnold
- et al.
- 1992
- Applied Physics Letters